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An Effective Solution to Thermal-Aware Test Scheduling on Network-on-Chip Using Multiple Clock Rates
Conference proceeding

An Effective Solution to Thermal-Aware Test Scheduling on Network-on-Chip Using Multiple Clock Rates

Hassan Salamy and Haidar Harmanani
2012 IEEE 55TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), pp.530-533
Midwest Symposium on Circuits and Systems Conference Proceedings
01/01/2012

Abstract

Computer Science, Information Systems Engineering, Electrical & Electronic Science & Technology Computer Science Engineering Technology

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