Atomistically Informed Electrostatic Model of an Edge Dislocation in a Complex Crystalline Material: Scale Effects in Mechanics

Journal article

Peer reviewed

JEONG HO You, Jun-Qiang LU and H. T Johnson

Mathematics and mechanics of solids, Vol.13(3-4), pp.267-291

2008

Abstract

Applied classical electromagnetism

Condensed matter: structure, mechanical and thermal properties

Defects and impurities in crystals; microstructure

Electromagnetic wave propagation, radiowave propagation

Electromagnetism; electron and ion optics

Exact sciences and technology

Fundamental areas of phenomenology (including applications)

Linear defects: dislocations, disclinations

Structural and continuum mechanics

Structure of solids and liquids; crystallography

Physics

Solid Mechanics

1 Record Views

Title: Atomistically Informed Electrostatic Model of an Edge Dislocation in a Complex Crystalline Material
Author/Creator: JEONG HO You - University of Illinois Urbana-Champaign
Jun-Qiang LU - University of Illinois Urbana-Champaign
H. T Johnson - University of Illinois Urbana-Champaign
Publication Details: Mathematics and mechanics of solids, Vol.13(3-4), pp.267-291
Publisher: Sage Science
Academic Unit: Mechanical Engineering
Language: English
Resource Type: Journal article
Record Identifier: 991015164197003691