Logo image
LibrarySearch
Sign in
Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing
Encyclopedia entry

Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing

R.I Bahar, Hui-Yuan Song, K Nepal and J Grodstein
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.24, pp.502-515
WTI-Frankfurt-digital GmbH
01/01/2005

Abstract

Entscheidungsdiagramm Schaltungsmodelluntersuchung Schaltungsrauschen Schaltungszuverlaessigkeit

Metrics

6 Record Views

Details