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Noise Margin-Optimized Ternary CMOS SRAM Delay and Sizing Characteristics
Conference proceeding

Noise Margin-Optimized Ternary CMOS SRAM Delay and Sizing Characteristics

Zafrullah Kamar, Kundan Nepal and IEEE
53RD IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, pp.801-804
Midwest Symposium on Circuits and Systems Conference Proceedings
01/01/2010

Abstract

Computer Science Computer Science, Information Systems Engineering Engineering, Electrical & Electronic Science & Technology Technology

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