- Title
- European Test Symposium Teams: an Anniversary Snapshot
- Author/Creator
- M. Jenihhin - Tallinn University of TechnologyJ. Raik - Tallinn University of TechnologyA. Jutman - Tallinn University of TechnologyN. Cherezova - Tallinn University of TechnologyR. Ubar - Tallinn University of TechnologyL. Miclea - Technical University of Cluj-NapocaS. Enyedi - Technical University of Cluj-NapocaI. Stefan - Technical University of Cluj-NapocaO. Stan - Technical University of Cluj-NapocaC. Corches - Technical University of Cluj-NapocaZ. Peng - Linköping UniversityP. Eles - Linköping UniversityR. Drechsler - University of BremenS. Eggersglus - Siemens EDA, Tessent, Hamburg, GermanyG. Fey - Hamburg University of TechnologyA. Glowatz - Siemens EDA, Tessent, Hamburg, GermanyD. Tille - Siemens EDA, Tessent, Hamburg, GermanyG. Gielen - KU LeuvenA. Coyette - Bonsemi Belgium, Mechelen, BelgiumW. Dobbelaere - Bonsemi Belgium, Mechelen, BelgiumR. Vanhooren - Bonsemi Belgium, Mechelen, BelgiumP. Y. Chuang - IMECE. J. Marinissen - IMECG. Di Natale - Institut polytechnique de GrenobleM. Barragan - Institut polytechnique de GrenobleP. Maistri - Institut polytechnique de GrenobleS. Mir - Institut polytechnique de GrenobleE. I. Vatajelu - Institut polytechnique de GrenobleP. Bernardi - Politecnico di Torino, ItalyS. Di Carlo - Politecnico di Torino, ItalyP. Prinetto - Politecnico di Torino, ItalyM. Sonza Reorda - Politecnico di Torino, ItalyM. Violante - Politecnico di Torino, ItalyH. G. Stratigopoulos - Sorbonne UniversitéM. K. Michael - University of CyprusS. Neophytou - University of CyprusS. Hadjitheophanous - University of CyprusK. Christou - University of CyprusM. Skitsas - University of CyprusA. Bosio - Université Claude Bernard Lyon 1B. Deveautour - Nantes UniversitéP. Girard - LIRMM, University of Montpellier/CNRS, Montpellier, FranceM. Traiola - Univ Rennes, Inria, CNRS, IRISA, Rennes, FranceA. Virazel - LIRMM, University of Montpellier/CNRS, Montpellier, FranceF. Fernandes Dos Santos - Univ Rennes, Inria, CNRS, IRISA, Rennes, FranceA. Kritikakou - Institut Universitaire de FranceG. Casagranda - University of TrentoM. Vallero - University of TrentoF. Vella - University of TrentoP. Rech - University of TrentoL. M. Bolzani Poehls - IHP Leibniz Institute for High Peformance Microelectroncis, Frankfurt Oder, GermanyM. Krstic - University of PotsdamM. Andjelkovic - IHP Leibniz Institute for High Peformance Microelectroncis, Frankfurt Oder, GermanyF. Vargas - IHP Leibniz Institute for High Peformance Microelectroncis, Frankfurt Oder, GermanyG. Tshagharyan - Synopsys Armenia, Embedded Test & Repair Group, Yerevan, ArmeniaG. Harutyunyan - Synopsys Armenia, Embedded Test & Repair Group, Yerevan, ArmeniaV. Vardanian - Synopsys Armenia, Embedded Test & Repair Group, Yerevan, ArmeniaS. Shoukourian - Synopsys Armenia, Embedded Test & Repair Group, Yerevan, ArmeniaY. Zorian - Synopsys Armenia, Embedded Test & Repair Group, Yerevan, ArmeniaJ. Dworak - Southern Methodist UniversityK. Nepal - University of St. Thomas - MinnesotaT. Manikas - Southern Methodist UniversityM. Taouil - Delft University of TechnologyM. Fieback - Delft University of TechnologyA. Gebregiorgis - Delft University of TechnologyR. Bishnoi - Delft University of TechnologyS. Hamdioui - Delft University of TechnologyA. Chatterjee - Georgia Institute of TechnologyA. Saha - Georgia Institute of TechnologyS. Komarraju - Intel Corporation, United StatesK. Ma - Rebellions AI, South KoreaC. Amarnath - Google Inc, Sunnyvale, CA, United StatesM. Tahoori - Karlsruhe Institute of TechnologyM. Mayahinia - Karlsruhe Institute of TechnologyM. Rajabalipanah - University of TehranK. Basharkhah - University of TehranN. Nosrati - University of TehranZ. Jahanpeima - University of TehranZ. Navabi - University of TehranH. J. Wunderlich - University of StuttgartS. Hellebrand - Paderborn University
- Publication Details
- Proceedings - European Test Workshop
- Academic Unit
- Electrical & Computer Engineering; School of Engineering
- Language
- English
- Resource Type
- Conference proceeding
- Record Identifier
- 991015334131303691
Conference proceeding
European Test Symposium Teams: an Anniversary Snapshot
Proceedings - European Test Workshop
2025
Metrics
1 Record Views