Abstract
A number of electronic devices have been tested for sensitivity to single event effects for space applications by Ball Aerospace & Technologies Corp. and collaborators. Test conditions and results are presented for each device.
- Title
- Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp
- Author/Creator
- John Bird - Ball Aerosp. & Technol. Corp., Boulder, CO, USARob Davies - BallDavid DuVal - Ball Aerosp. & Technol. Corp., Boulder, CO, USAForrest Gasdia - Ball Aerosp. & Technol. Corp., Boulder, CO, USACharlie Hamp - Ball Aerosp. & Technol. Corp., Boulder, CO, USARichard Horton - Ball Aerosp. & Technol. Corp., Boulder, CO, USATim Koval - Ball Aerosp. & Technol. Corp., Boulder, CO, USAJennifer Lee - Ball Aerosp. & Technol. Corp., Boulder, CO, USAKristin Marino - Ball Aerosp. & Technol. Corp., Boulder, CO, USATimothy O'Connor - Ball Aerosp. & Technol. Corp., Boulder, CO, USASana Rezgui - MEI TechnologiesDakai Chen - NASA GSFC, Greenbelt, MD, USAMegan C. Casey - NASA GSFC, Greenbelt, MD, USAHak S. Kim - MEI TechnologiesAnthony M. Phan - MEI TechnologiesIEEE
- Publication Details
- 2013 IEEE Radiation Effects Data Workshop (REDW), pp.1-5
- Publisher
- IEEE
- Academic Unit
- Physics
- Language
- English
- Resource Type
- Conference proceeding
- Record Identifier
- 991015167121203691